COMPUTED ELECTRON MICROGRAPHS AND DEFECT IDENTIFICATION
Material type:
TextSeries: Defects In Crystalline Solids ; V. 7Publication details: Amsterdam North-Holand 1973Description: 400Subject(s): DDC classification: - 548.8 H34a
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | General Stacks | 548.8 H34a (Browse shelf(Opens below)) | Available | A33033 |
Total holds: 0
References : P.387-389
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