PRINCIPLES OF TESTING ELECTRONIC SYSTEMS

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Material type: Text

TextPublication details: John Wiley, New York 2000Description: xix,420ISBN:

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Holdings
Item type	Current library	Collection	Call number	URL	Status	Date due	Barcode	Item holds
Books	PK Kelkar Library, IIT Kanpur	COMPACT STORAGE (BASEMENT)	621.381548 M866P (Browse shelf(Opens below))	Link to resource	Available		A132598

Total holds: 0

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Previous	621.381548 In8t TECHNOLOGICAL AND METHODOLOGICAL ADVANCES IN MEASUREMENT	621.381548 K233B BURN-IN TESTING	621.381548 M224t THERMISTORS	621.381548 M866P PRINCIPLES OF TESTING ELECTRONIC SYSTEMS	621.381548 P871t TESTING ACTIVE AND PASSIVE ELECTRONIC COMPONENTS	621.381548 R259c CATHODE RAY OSCILLOSCOPE	621.381548 R542A ANALOG SIGNAL GENERATION FOR BUILT-IN-SELF-TEST OF MIXED-SIGNAL INTEGRATED CIRCUITS	Next

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