Image from Amazon.com
Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM [2nd ed.]
Language: English Publication details: Switzerland Springer 2016Edition: 2nd edDescription: xi, 196pISBN:- 9783319398761
- 502.825 Eg26p2
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
Text Books
|
PK Kelkar Library, IIT Kanpur | TEXT | 502.825 Eg26p2 (Browse shelf(Opens below)) | Available | A182978 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur shelves, Collection: TEXT Close shelf browser (Hides shelf browser)
|
|
|
|
|
|
No cover image available | ||
| 423 OX2H6 OXFORD ADVANCED LEARNER'S DICTIONARYOF CURRENT ENGLISH | 502.8 SC63 Scanning electron microscopy and X-Ray microanalysis | 502.82 SCI27 Science of microscopy [v.1] | 502.825 Eg26p2 Physical principles of electron microscopy | 502.825 G618e2 Electron microscopy and analysis [2nd ed.] | 502.825 W671T TRANSMISSION ELECTRON MICROSCOPY | 510 B63m3 cop.1 Mathematical methods in physical sciences [3rd ed.] |
There are no comments on this title.
Log in to your account to post a comment.