COMPUTED ELECTRON MICROGRAPHS AND DEFECT IDENTIFICATION
Material type:
TextSeries: Defects In Crystalline Solids ; V. 7Publication details: Amsterdam North-Holand 1973Description: 400Subject(s): DDC classification: - 548.8 H34a
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PK Kelkar Library, IIT Kanpur | General Stacks | 548.8 H34a (Browse shelf(Opens below)) | Available | A33033 |
Total holds: 0
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| 548.8 C554s SURFACE CRYSTALLOGRAPHY | 548.8 C66d DIFFRACTION METHODS IN MATERIALS SCIENCE | 548.8 H296P PHYSICAL PROPERTIES OF CRYSTALS | 548.8 H34a COMPUTED ELECTRON MICROGRAPHS AND DEFECT IDENTIFICATION | 548.8 H426c Crystallography and surface structure | 548.8 In8e ELECTRON DIFFRACTION | 548.8 In8L LATTICE DYNAMICS |
References : P.387-389
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